JEOL ARM-200CF Scanning Transmission Electron Microscope
The ARM is an aberration-corrected microscope that is uses a sub-angstrom probe to collect atomic-resolution imaging and chemical analysis. The ARM is also capable of energy dispersive spectroscopy (EDS)using a silicon drift detector (SDD) to acquire high count rates. The instrument can be operated at several acceleration voltages and collect high-angle annular dark field (HAADF), bright field (BF), and annular bright field (ABF) images. More information about the ARM
FEI Scios Focused Ion Beam
The Scios was customized to prepare high quality transmission electron microscopy specimens. The maximum milling current of 65 nA allows for accelerated preparation of ceramics and refractory metals. The minimum ion-beam energy of 5kV permits surface cleaning to produce optimal atomic-resolution imaging and chemical analysis. The FIB was also recently outfitted with a electron backscatter detector to collect 3-dimensional grain boundary character distributions and facilitate special grain boundary preparation.
Hitachi 4300 SE/N Scanning Electron Microscope/ EBSD
The Hitachi has a field-emission gun and is also equipped with an electron backscatter detector (EBSD). This is our workhorse instrument to collect large data sets for grain boundary informatics. The microscope also has a SDD for high throughput EDS maps.